It can be matched with scanning electron microscopy, optical microscopy, XRD, AFM and other instruments to perform in-situ characterization tests on mechanical properties such as tensile, bending, compression, creep, etc. of materials.
In situ mechanical testing system
In situ mechanical testing system
Product overview
产品特点
PRODUCTFEATURE
The product has a compact structure, small size, light weight, good compatibility, ultra rigid design, intelligent control, high-precision measurement and control, etc
The bidirectional double screw transmission mechanism ensures system stiffness, transmission accuracy, and stability while ensuring that the sample observation gauge segment is always at the center of the scanning electron microscope field of view, facilitating tracking and positioning
Self locking structure, can pause at any time, easy to observe high-resolution image capture of different areas in the field of view
The product models are complete and can be matched with various scanning electron microscopes, optical microscopes, XRD, AFM and other instruments
Mechanical performance tests such as in-situ tensile, compressive, three-point bending, creep, etc. can be conducted
In situ analysis and mechanical performance testing of SE mode and EBSD mode can be achieved in scanning electron microscopy
应用案例
PRODUCTSCENARIO
Tensile mechanical properties and deformation fracture of nickel based polycrystalline superalloys
Initiation and propagation of tensile cracks in nickel based polycrystalline superalloys
EBSD characterization of nickel based polycrystalline high-temperature alloys under tensile stress
Morphology and DIC strain evolution of gas film pore tensile deformation in nickel based single crystal superalloys
产品规格
PRODUCTPARAMETER
| Load range | 10N～5kN (5kN~10kN can be customized) |
| Load control accuracy | ±1N |
| Maximum loading stroke | 45mm |
| Loading rate | 0.1μm/s~10μm/s (Can be customized) |
| Displacement accuracy | 100nm |
| The equipment can be started and stopped at any time during the in-situ operation, which is convenient for the real-time image acquisition of the scanning electron microscope. | |
| Control mode | Displacement control mode |
| Standard fixture | Stretching, compressing, three-point bending |
| Supporting accessories | SEM high-vacuum terminal flange, fixed connection flange of the tensile stage |
| System power requirements | 220V，50Hz，500W |