Testing service
In response to the demand of domestic users for in-situ SEM high-temperature mechanical performance testing, Qiyue Technology R&D Center has arranged professional technical personnel to provide high-level testing services for everyone.
Qiyue Technology currently has multiple field emission scanning electron microscopes, combined with the latest self-developed in-situ high-temperature mechanical instruments, and can provide more than 10 series of in-situ SEM high-temperature mechanical performance testing services. Qiyue Technology has established close cooperation with research teams from Zhejiang University and Beijing University of Technology, and has systematic and professional knowledge and technical accumulation in scanning electron microscopy in-situ analysis instruments, applications, methods, experimental plan formulation, data analysis, etc. It can provide integrated solutions for experimental plan formulation, testing characterization, data analysis, etc. for users.
High resolution scanning electron microscopy in-situ heating (up to 1200 ℃) test
The in-situ heating experiment is mainly used to study the dynamic changes during the material heating test process. Compared to traditional heat treatment, it is used in combination with high-resolution field emission scanning electron microscopy to observe the dynamic changes in material structure (phase transition, melting, etc.). Equipment parameters: Field emission scanning electron microscope; Temperature: Room temperature~1200 ℃; Temperature accuracy: ± 2 ℃; Test materials: metal materials, composite materials, ceramic materials, rock materials, etc; Test data: SE, BSE timing images; In situ video recording of melting phase transition.
High resolution scanning electron microscopy in-situ heating (within 1200 ℃) test
The in-situ heating experiment is mainly used to study the dynamic changes during the material heating test process. Compared to traditional heat treatment, it is used in combination with high-resolution field emission scanning electron microscopy to observe the dynamic changes in material structure (phase transition, melting, etc.). Equipment parameters: Field emission scanning electron microscope; Temperature: Room temperature~1200 ℃; Temperature accuracy: ± 2 ℃; Test materials: metal materials, composite materials, ceramic materials, rock materials, etc; Test data: SE, BSE timing images; In situ video recording of melting phase transition
High resolution scanning electron microscopy in-situ heating (within 1200 ℃) test
The in-situ heating experiment is mainly used to study the dynamic changes during the material heating test process. Compared to traditional heat treatment, it is used in combination with high-resolution field emission scanning electron microscopy to observe the dynamic changes in material structure (phase transition, melting, etc.). Equipment parameters: Field emission scanning electron microscope; Temperature: Room temperature~1200 ℃; Temperature accuracy: ± 2 ℃; Test materials: metal materials, composite materials, ceramic materials, rock materials, etc; Test data: SE, BSE timing images; In situ video recording of melting phase transition
扫描电镜高分辨原位高温蠕变/疲劳测试（1200℃）
设备参数：场发射扫描电子显微镜;原位蠕变载荷范围：10~5000N;蠕变速率：0.1~10um/s;疲劳频率：≤0.3Hz;疲劳应力比：0~1拉拉疲劳;温度：室温~1200℃;温度精度：±2℃;测试材料：金属材料，复合材料等;测试数据：SE时序图片；力时间曲线；原位录像视频 ...
Scanning electron microscopy high-resolution in-situ high-temperature creep/fatigue testing (within 1000 ℃)
Equipment parameters: Field emission scanning electron microscope; In situ creep load range: 10~5000N; Creep rate: 0.1~10um/s; Fatigue frequency: ≤ 0.3Hz; Fatigue stress ratio: 0~1 pull fatigue; Temperature: Room temperature~1000 ℃; Temperature accuracy: ± 2 ℃; Test materials: metal materials, composite materials, etc; Test data: SE timing images; Force time curve; In situ video recording
High resolution scanning electron microscopy in-situ heating (within 1000 ℃) test
The in-situ heating experiment is mainly used to study the dynamic changes during the material heating test process. Compared to traditional heat treatment, it is used in combination with high-resolution field emission scanning electron microscopy to observe the dynamic changes in material structure (phase transition, melting, etc.). Equipment parameters: Field emission scanning electron microscope; Temperature: Room temperature~1000 ℃; Temperature accuracy: ± 2 ℃; Test materials: metal materials, composite materials, ceramic materials, rock materials, etc; Test data: SE, BSE timing images; In situ video recording of melting phase transition
Scanning electron microscopy high-resolution in-situ high-temperature tensile testing (1200 ℃)
Equipment parameters: Field emission scanning electron microscope; In situ tensile load range: 10~5000N; Stretching rate: 0.1~10um/s; Temperature: 1000~1200 ℃; Temperature accuracy: ± 2 ℃; Test materials: metal materials, composite materials, ceramic materials, rock materials, etc; Test data: SE timing images; Force displacement curve; In situ video recording of melting phase transition
Scanning electron microscopy high-resolution EBSD in-situ high-temperature tensile testing (900 ℃)
Equipment parameters: Field emission scanning electron microscope; Integrated EBSD detector; In situ tensile load range: 10~5000N; Stretching rate: 0.1~10um/s; Temperature: 650-900 ℃; Temperature accuracy: ± 2 ℃; Test materials: metal materials, composite materials, etc; Test data: SE timing images; EBSD grain diagram; Force displacement curve; In situ video recording
Scanning electron microscopy high-resolution in-situ high-temperature tensile testing (within 1000 ℃)
Equipment parameters: Field emission scanning electron microscope; In situ tensile load range: 10~5000N; Stretching rate: 0.1~10um/s; Temperature: Room temperature~1000 ℃; Temperature accuracy: ± 2 ℃; Test materials: metal materials, composite materials, ceramic materials, rock materials, etc; Test data: SE, BSE timing images; Force displacement curve; In situ video recording of melting phase transition
Scanning electron microscopy high-resolution EBSD in-situ high-temperature tensile testing (within 650 ℃)
Equipment parameters: Field emission scanning electron microscope; Integrated EBSD detector; In situ tensile load range: 10~5000N; Stretching rate: 0.1~10um/s; Temperature: Room temperature~650 ℃; Temperature accuracy: ± 2 ℃; Test materials: metal materials, composite materials, etc; Test data: SE timing images; EBSD grain diagram; Force displacement curve; In situ video recording